Paper Title:
Growth and Characterization of BaZrO3 Buffer Layer for Textured YBCO Thin Films Growth on MgO (00l) Substrate
  Abstract

Superconducting YBa2Cu3O7-δ(YBCO) films were grown on MgO single crystalline substrates using a BaZrO3 (BZO) buffer layer deposited by a pulsed laser deposition (PLD). Deposition condition has been optimized to obtain good epitaxial BZO film followed by deposition of YBCO superconducting films. The crystallinity and microstructure of epitaxial YBCO/ BZO/ MgO (00l) films were investigated by a two-dimensional x-ray diffraction and a field emission scanning electron microscope. The in-plane (φ-scan) measurements for the BZO films (200 ~ 500 nm thick) grown on MgO substrates revealed a narrow full width half maximum (0φ = 2o). The XRD results exhibited that YBCO films with a BZO buffer layer were well oriented in the [00l] direction perpendicular to the substrate surface. The BZO films also showed homogeneous and dense surface morphologies. By the deposition of a subsequent BZO buffer layer, YBCO was grown epitaxially on MgO with results showing a critical current density (Jc) of ~ 3.3 × 106 A/cm2 and a critical temperature (Tc) of 86 K.

  Info
Periodical
Key Engineering Materials (Volumes 336-338)
Edited by
Wei Pan and Jianghong Gong
Pages
715-718
DOI
10.4028/www.scientific.net/KEM.336-338.715
Citation
J. K. Chung, W. J. Kim, S. G. Lee, C. J. Kim, "Growth and Characterization of BaZrO3 Buffer Layer for Textured YBCO Thin Films Growth on MgO (00l) Substrate", Key Engineering Materials, Vols. 336-338, pp. 715-718, 2007
Online since
April 2007
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$32.00
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