Paper Title:
Study of Ti3Si1.2-xAlxC2 (x = 0~1.2) Solid Solution via X-Ray Diffraction
  Abstract

A search for Ti3Si1.2-xAlxC2 (x=0~1.2) solid solution was undertaken using precise X-ray diffraction measurements. The samples covering the whole concentration range were studied. Except very ends of the concentration range, the samples contained two phases, identified as Ti3Si1.2-xAlxC2 solid solution and TiC respectively. Lattice parameter, a increased, c increased, c/a increased, and cell volume increased with the increasing of Al concentration.

  Info
Periodical
Key Engineering Materials (Volumes 336-338)
Edited by
Wei Pan and Jianghong Gong
Pages
952-954
DOI
10.4028/www.scientific.net/KEM.336-338.952
Citation
C. W. Li, H. X. Zhai, Y. Ding, Y. Zhou, S. B. Li, Z. L. Zhang, "Study of Ti3Si1.2-xAlxC2 (x = 0~1.2) Solid Solution via X-Ray Diffraction", Key Engineering Materials, Vols. 336-338, pp. 952-954, 2007
Online since
April 2007
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$32.00
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