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Applications of Polishing Technology Using Polymer Particles to Silicon Wafers and Quartz Crystal Wafers

Journal Key Engineering Materials (Volume 339)
Volume Progress of Precision Engineering and Nano Technology
Edited by Shen Dong and Yingxue Yao
Pages 263-268
DOI 10.4028/www.scientific.net/KEM.339.263
Citation Y.S. Lu et al., 2007, Key Engineering Materials, 339, 263
Online since May, 2007
Authors Y.S. Lu, Yasuhiro Tani, K. Soutome, Yasushi Kamimura
Keywords Edge Profile, Polishing, Polymer Particle, Roll-Off
Abstract

This paper deals with a novel polishing technology using polymer particles. It has been proposed and developed by the authors for the purpose of solving the problems associated with polishing pads such as pad deterioration, process inconsistency and poor accuracy. Single side polishing of silicon wafers and double side polishing of quartz crystal square wafers were performed to clarify the basic characteristics of the technology. The results showed that appropriate combination of tool plate with polymer particles could greatly improve polishing characteristics. In particular, the edge profiles can be controlled to have desirable shape as well as amplitudes.

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