Paper Title:
Residual Area Max Depth Model for Nanoindentation Hardness Size Effect of Single Crystal Silicon
  Abstract

In material nanoindentation hardness testing, the hardness will decrease with the indentation depth or peak load increase, i.e. indentation size effect (ISE). There are several models and equations were proposed to describe ISE. But the variables self-inaccurate in these models and equations, it will affect the result trueness. Single crystal silicon was used for nanoindentation experiments, and max depths were obtained from these experiments. Combining Matlab software, residual areas were obtained by atomic force microscopy (AFM). Based on max depth and residual area, a new model—residual area max depth model was proposed for indentation size effect in nanoindentaion hardness. The new model perhaps can understand and describe ISE in indentation hardness better than other models and equations.

  Info
Periodical
Edited by
Shen Dong and Yingxue Yao
Pages
389-394
DOI
10.4028/www.scientific.net/KEM.339.389
Citation
L. Zhou, Y. X. Yao, S. A. Pahlovy, "Residual Area Max Depth Model for Nanoindentation Hardness Size Effect of Single Crystal Silicon", Key Engineering Materials, Vol. 339, pp. 389-394, 2007
Online since
May 2007
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$32.00
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