Paper Title:
Adhesion Test of Nanostructured Materials by a Novel AFM Probe
  Abstract

We have developed a novel atomic force microscope (AFM) probe as a highly sensitive sensor and an application of the probe into various mechanical tests for characterizing micro/nanostructures. Using MEMS fabrication technique, we have designed and fabricated rhombus-shaped symmetric AFM probe. Adhesion forces between silicon tip and artificial nano-hair structures of cyclic olefin copolymer (COC) and polypropylene (PP) were measured using the probe with a flat tip. The results exhibited the usual characteristics of force-displacement curves of COC and PP nano-hair structures, in which a pull-off force was detected at the point of unloading. The average adhesion forces of the COC and PP hair structures are about 9.48 μN and 10.67 μN, respectively.

  Info
Periodical
Key Engineering Materials (Volumes 353-358)
Edited by
Yu Zhou, Shan-Tung Tu and Xishan Xie
Pages
2253-2256
DOI
10.4028/www.scientific.net/KEM.353-358.2253
Citation
H. J. Lee, J. H. Kim, K. H. Cho, S. M. Hyun, J. Y. Kim, Y. E. Yoo, W. D. Kim, "Adhesion Test of Nanostructured Materials by a Novel AFM Probe", Key Engineering Materials, Vols. 353-358, pp. 2253-2256, 2007
Online since
September 2007
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Price
$32.00
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