A Crack in an Electrode Layer between Two Dissimilar Piezoelectric Materials |
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| Journal | Key Engineering Materials (Volumes 353 - 358) |
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| Volume | Progresses in Fracture and Strength of Materials and Structures |
| Edited by | Yu Zhou, Shan-Tung Tu and Xishan Xie |
| Pages | 231-234 |
| DOI | 10.4028/www.scientific.net/KEM.353-358.231 |
| Citation | Hyeon Gyu Beom et al., 2007, Key Engineering Materials, 353-358, 231 |
| Online since | September, 2007 |
| Authors | Hyeon Gyu Beom, Y.H. Kim, C.K. Yoon, Chong Du Cho |
| Keywords | Energy Release Rate, Interfacial Crack, Piezoelectric Ceramic (PZT) |
| Abstract | A crack on the conductive interface between two dissimilar piezoelectric ceramics under electromechanical loading is investigated. The closed form of the singular crack tip fields for the interface crack is derived here using an analysis based on analytic functions. It is shown that the interfacial crack-tip field consists of a pair of oscillatory singularities. A closed form of the solution for a finite crack on the conductive interface between dissimilar piezoelectric media is also derived. |
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