Paper Title:
In Situ Thermal-Mechanical Fatigue Testing of Thin Au Lines
  Abstract

An in-situ testing system for thermal-mechanical fatigue of thin metal lines was setup inside a dual-beam focused ion beam (FIB)/scanning electron microscope (SEM) system. Alternating currents (AC) were applied to narrow Au lines 200-nm-thick through nanomanipulator needles. Preliminary results show that severe thermal-mechanical fatigue damage can be generated by the action of the applied AC. The in-situ recording of the evolution of the damage has been carried out and the possible mechanism of the thermal-mechanical fatigue damage in the Au lines resulted from the joule heating was discussed.

  Info
Periodical
Key Engineering Materials (Volumes 353-358)
Edited by
Yu Zhou, Shan-Tung Tu and Xishan Xie
Pages
2916-2919
DOI
10.4028/www.scientific.net/KEM.353-358.2916
Citation
G.P. Zhang, B. Zhang, Q.Y. Yu, J. Tan, "In Situ Thermal-Mechanical Fatigue Testing of Thin Au Lines", Key Engineering Materials, Vols. 353-358, pp. 2916-2919, 2007
Online since
September 2007
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.

Authors: Hidehiko Kimura, Yuka Kojima, Yoshiaki Akiniwa, Keisuke Tanaka, Takaaki Ishida
Abstract:Electron backscattering diffraction, EBSD, technique as well as atomic force microscopy, AFM, was employed to investigate fatigue damage...
943
Authors: Jeong Guk Kim, Peter K. Liaw
Abstract:The fracture behavior of ceramic matrix composites (CMCs) was investigated using the infrared (IR) thermography nondestructive evaluation...
649
Authors: Jia Zhen Zhang, Xiao Dong He, Shan Yi Du
Abstract:In-situ SEM observations have revealed that fatigue crack propagation in aluminium alloys is caused by the shear band decohesion around the...
293
Authors: Meng Jie, Hai Feng Xie, Yan Liu, Zhi Gang Yang
Chapter 7: Industrial Equipment and Engineering
Abstract:In order to measure the fatigue property of the small and hard brittle components working under conditions of the little amplitude, high...
543