Paper Title:
Interface Cracking of Plastic Electronic Package under Temperature and Humidity Environment
  Abstract

Structural model of plastic electronic package under temperature and humidity is constructed, and the coupling of the thermal and moisture impact on structure field is implemented. The impact of thermal expansion, hygro-swelling and vapor pressure increases with increasing initial defect, especially the impact of vapor pressure. At certain crack length, KI and KII induced by thermal expansion is proportional to temperature difference, and KI and KII induced by vapor is proportional to vapor pressure. The impacts of thermal expansion and hygro-swelling on ERR decrease during crack propagation, but the impact of vapor pressure increases significantly.

  Info
Periodical
Key Engineering Materials (Volumes 353-358)
Edited by
Yu Zhou, Shan-Tung Tu and Xishan Xie
Pages
2940-2943
DOI
10.4028/www.scientific.net/KEM.353-358.2940
Citation
X. Chen, S. F. Zhao, L. Zhai, "Interface Cracking of Plastic Electronic Package under Temperature and Humidity Environment", Key Engineering Materials, Vols. 353-358, pp. 2940-2943, 2007
Online since
September 2007
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Price
$32.00
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