Paper Title:
Tilt of Atomic Force Microscope Cantilevers: Effect on Friction Measurements
  Abstract

The cantilevers of atomic force microscope (AFM) are mounted under a certain tilt angle, which is commonly assumed to have negligible effect on friction measurements in AFM. We present a theoretical study of the effect of the tilt angle on AFM based friction measurements. A method for correcting the friction coefficient between sample surfaces and AFM tips is also presented to minimize the effects of the tilt. The frictional forces between a silicon tip and a silicon surface at tilt angles ranging from 5 degrees to 25 degrees were measured. The results show that the measured friction coefficient increases with the tilt angle effectively, whereas the variation range of the corrected friction coefficient is within 10%.

  Info
Periodical
Key Engineering Materials (Volumes 353-358)
Edited by
Yu Zhou, Shan-Tung Tu and Xishan Xie
Pages
742-745
DOI
10.4028/www.scientific.net/KEM.353-358.742
Citation
F. Wang, X. Z. Zhao, "Tilt of Atomic Force Microscope Cantilevers: Effect on Friction Measurements", Key Engineering Materials, Vols. 353-358, pp. 742-745, 2007
Online since
September 2007
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Price
$32.00
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