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The Performance and Optimization of Slurry on the Double Sided Polishing Process of Silicon Wafer

Journal Key Engineering Materials (Volumes 359 - 360)
Volume Advances in Grinding and Abrasive Technology XIV
Edited by Jiuhua Xu, Xipeng Xu, Guangqi Cai and Renke Kang
Pages 324-328
DOI 10.4028/www.scientific.net/KEM.359-360.324
Citation Wei Li et al., 2007, Key Engineering Materials, 359-360, 324
Online since November, 2007
Authors Wei Li, Gang Xiang Hu, Xiao Dong Hu, Xiao Zhen Hu
Keywords Double Sided Polishing, Optimization, Silicon Wafer, Slurry
Abstract

This study compares the effectiveness of different polishing slurries for Double Sided Polishing process of Silicon wafer in the polished surface roughness and stock removal rate, discusses the mechanism of Double Sided Polishing for silicon wafer with different type slurries, also the influence of the pH value, temperature and concentration of the slurries are discussed in this paper. Furthermore, by the optimization of the process parameters, the ultra-smooth of polished surface of silicon wafer has been got with higher efficient.

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