Study on Removal Mechanism of Fixed-Abrasive Diamond Wire Saw Slicing Monocrystalline Silicon
| Periodical | Key Engineering Materials (Volumes 359 - 360) |
|---|---|
| Main Theme | Advances in Grinding and Abrasive Technology XIV |
| Edited by | Jiuhua Xu, Xipeng Xu, Guangqi Cai and Renke Kang |
| Pages | 450-454 |
| DOI | 10.4028/www.scientific.net/KEM.359-360.450 |
| Citation | Yu Fei Gao et al., 2007, Key Engineering Materials, 359-360, 450 |
| Online since | November, 2007 |
| Authors | Yu Fei Gao, Pei Qi Ge, Zhi Jian Hou |
| Keywords | Brittle-Ductile Transition, Monocrystalline Silicon, Removal Mechanism, Wire Saw |
| Price | US$ 28,- |
The physical model of fixed-abrasive diamond wire-sawing monocrystalline silicon was founded to analyze the elastic deformation of the wire, supposing that every grit was connected to the surface of the wire by a spring. Ignoring lateral vibration of the wire, the geometrical model of wire-sawing was founded; the average cut depth of single grit was calculated theoretically. Based the indentation fracture mechanics and investigations on brittle-ductile transition of machining monocrystalline silicon, the removal mechanism and surface formation was studied theoretically. It shows that in the case of wire-sawing velocity of 10m/s or higher, infeed velocity of 0.20mm/s and diamond grain size of 64μm or smaller, the chip formation and material removal is in a brittle regime mainly, but the silicon wafer surface formation is sawed in a ductile regime. The size of the abrasives, the wire-saw velocity and infeed velocity can influence the sawing process obviously.