Preparation and Properties of CaCu3Ti4O12 Thick Film by Aerosol Deposition Method |
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| Journal | Key Engineering Materials (Volumes 368 - 372) |
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| Volume | High-Performance Ceramics V |
| Edited by | Wei Pan and Jianghong Gong |
| Pages | 126-128 |
| DOI | 10.4028/www.scientific.net/KEM.368-372.126 |
| Citation | Ji Feng Ma et al., 2008, Key Engineering Materials, 368-372, 126 |
| Online since | February, 2008 |
| Authors | Ji Feng Ma, Yuan Hua Lin, Ce Wen Nan, Takaaki Tsurumi |
| Keywords | Aerosol Deposition (AD) Method, CaCu3Ti4O12 (CCTO), Dielectric Constant |
| Abstract | CaCu3Ti4O12 (CCTO) ceramic thick films have been prepared on Copper substrate, using ceramic powders by an aerosol deposition method (ADM). The ceramic powders are prepared by traditional solid state reaction processing at 1100 oC for 5 h. X-ray diffraction and scanning electron microscopy are used to investigate the microstructure and the phase composition of the deposited films. The results indicate that thick films are pure CCTO phase and homogenous. The dielectric impedance spectra indicate that the dielectric constant of CCTO thick film can reach 3×103. |
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