Preparation and Characterization of Relaxor-Based Ferroelectric Thick Films with Single Perovskite Structure
| Periodical | Key Engineering Materials (Volumes 368 - 372) |
|---|---|
| Main Theme | High-Performance Ceramics V |
| Edited by | Wei Pan and Jianghong Gong |
| Pages | 24-26 |
| DOI | 10.4028/www.scientific.net/KEM.368-372.24 |
| Citation | Hui Qing Fan et al., 2008, Key Engineering Materials, 368-372, 24 |
| Online since | February, 2008 |
| Authors | Hui Qing Fan, Jin Chen, Xiu Li Chen |
| Keywords | Electrophoretic Deposition (EPD), Perovskite, PMN-PT, Thick Film |
| Price | US$ 28,- |
Lead magnesium niobate-lead titanate (0.8Pb(Mg1/3Nb2/3)O3-0.2PbTiO3, PMN-PT) thick films in the thickness range about 75 μm have been successfully fabricated on Au-coated Al2O3 substrates by electrophoretic deposition (EPD). Non-aqueous colloidal suspensions suitable for EPD were prepared by mixing ultrasonically PMN-PT particles in ethanol with pH=6.0. The effect of EPD process parameters such as deposition voltage, deposition time and the specific deposition mass of PMN-PT particles were investigated. The EPD parameters were optimized in order to obtain crack-free, high-quality uniform ceramic films. The deposited pyrochlore-free PMN-PT thick films were sintered at 1000oC for 30 min, and the phase evolvement and the microstructure of the film were characterized by X-ray diffraction and scanning electron microscope.