Paper Title:
Cation Distribution and Structural Instability in Pr-Doped Bi4Ti3O12
  Abstract

Pr-doped bismuth titanate (BixPryTi3O12: BPT) thin films with random orientation were fabricated on Pt/Ti/SiO2/Si substrates by rf magnetron sputtering technique, and the structures and Raman spectra of the films were investigated. XRD studies indicated that all of the BPT films consist of single phase of a bismuth-layered structure, showing a highly (117) oriented preferential growth with a minor fraction of (00l) orientation. For an increasing degree of Pr doping, Raman spectra studies revealed a substantial hardening of the vibration involving Bi atoms at the perovskite A site, whereas the Bi mode at the Bi2O2 layer is negligibly changed. From a comparison with a simple mass consideration, we identify a precise cation distribution, indicating a pronounced site selectivity of Pr ions for the A site for y ~ 1.2.

  Info
Periodical
Key Engineering Materials (Volumes 368-372)
Edited by
Wei Pan and Jianghong Gong
Pages
85-87
DOI
10.4028/www.scientific.net/KEM.368-372.85
Citation
X.A. Mei, M. Chen, W.K. An, C. Q. Huang, J. Liu, A.H. Cai, "Cation Distribution and Structural Instability in Pr-Doped Bi4Ti3O12", Key Engineering Materials, Vols. 368-372, pp. 85-87, 2008
Online since
February 2008
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Price
$32.00
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