Investigation on Strain Films in the Thin Film Resistance Strain Gauge |
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| Journal | Key Engineering Materials (Volumes 375 - 376) |
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| Volume | Advances in Machining & Manufacturing Technology IX |
| Edited by | Yingxue Yao, Xipeng Xu and Dunwen Zuo |
| Pages | 690-694 |
| DOI | 10.4028/www.scientific.net/KEM.375-376.690 |
| Citation | Rong Fa Chen et al., 2008, Key Engineering Materials, 375-376, 690 |
| Online since | March, 2008 |
| Authors | Rong Fa Chen, Dun Wen Zuo, Yu Li Sun, Duo Sheng Li, Wen Zhuang Lu, Min Wang |
| Keywords | Electromechanical Properties, Nichrome Thin Film, Thin Film Resistance Strain Gauge |
| Abstract | Strain films in the thin film resistance strain gauge are prepared by magnetron sputtering method. Some results concerning the electromechanical and structural properties of nichrome (Ni80Cr20 wt.%) thin films are presented. As compared to the well-known Ni-Cu (constantan) alloy film, which are widely used for manufacturing pressure and force sensors, nichrome (Ni80Cr20 wt.%) thin films exhibit gauge factor values of the same order of magnitude, but they are much more corrosion resistant and adherent to the substrate. The influences of composition and post-deposition annealing on the electrical resistance, temperature coefficient of resistance (TCR) and gauge factor of nichrome (Ni80Cr20 wt.%) thin films are discussed. |
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