Measurement Technology and Intelligent Instruments VIII
Key Engineering Materials Volumes 381 - 382
doi:10.4028/www.scientific.net/KEM.381-382
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Sponsors
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6 K
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Reviewers
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10 K
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Preface
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8 K
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Engineering Nanotechnology: The Top Down Approach
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643 K
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Authors: Robert J. Hocken, R. Fesperman, J. Overcash, O. Ozturk, C. Stroup -
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Dimensional Measurements for Micro- and Nanotechnology
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229 K
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Authors: Gao Liang Dai, F. Pohlenz, H.U. Danzebrink, L. Koenders -
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Recent Advances in our Research on Ultrahigh Resolution Laser Confocal Microscopy
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236 K
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Authors: Jiu Bin Tan, Jian Liu -
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Reliable Detection of Periodic Micro Structures on Open Surfaces
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283 K
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Authors: F. Härtig, Michael Paul Krystek, S. Klein -
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The Assessment of Functional Properties of Surfaces with Morphological Operations
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927 K
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Authors: Michael Dietzsch, S. Gröger, M. Gerlach, Michael Paul Krystek -
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Tactile and Optical Microsensors - Test Procedures and Standards
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2 M
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Authors: Ulrich Neuschaefer-Rube, Michael Neugebauer, W. Ehrig, M. Bartscher, U. Hilpert -
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Simulation of Light Scattering from Nanostructured Surfaces
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731 K
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Authors: Andreas Tausendfreund, S. Patzelt, S. Simon, G. Goch -
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Characterization and Manipulation of Boron Nanowire inside SEM
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229 K
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Authors: Ming Chang, C.H. Lin, Juti Rani Deka -
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AFM with the Slope Compensation Technique for High-Speed Precision Measurement of Micro-Structured Surfaces
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3 M
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Authors: Yu Guo Cui, Bing Feng Ju, J. Aoki, Yoshikazu Arai, Wei Gao -
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Compact Displacement Measurement System Based on Microchip Nd:YAG Laser with Birefringence External Cavity
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269 K
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Authors: Y. Tan, S. Zhang -
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New Synthetic Heterodyne Laser Doppler Vibrometer for Measurement of Mechanical Vibrations with Submicron Amplitude
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392 K
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Authors: Seong Gu Kang, J.P. La, H.S. Yoon, D.Y. Choi, K.H. Park -
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Development of the Precision Stage with Nanometer Accuracy and a Millimeter Dynamic Range
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211 K
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Authors: D.H. Jeong, Hyun Kyu Kweon, Y.S. Kim
