Paper Title:
A Study on Surface Material Measures for Areal Surface Texture Measuring Instruments: Measuring Conditions for the Areal Profiling
| Periodical | Key Engineering Materials (Volumes 381 - 382) |
|---|---|
| Main Theme | Measurement Technology and Intelligent Instruments VIII |
| Edited by | Wei Gao, Yasuhiro Takaya, Yongsheng Gao and Michael Krystek |
| Pages | 241-244 |
| DOI | 10.4028/www.scientific.net/KEM.381-382.241 |
| Citation | Kentaro Nemoto et al., 2008, Key Engineering Materials, 381-382, 241 |
| Online since | June, 2008 |
| Authors | Kentaro Nemoto, Kazuhisa Yanagi, Masato Aketagawa, D. Kanda, I. Yoshida, M. Uchidate |
| Keywords | Areal Surface Texture, Calibration, Material Measure, Software Gauge, Surface Metrology |
| Price | US$ 28,- |
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Abstract
This paper describes the software gauge data for surface texture standard using the non-causal 2D auto-regressive model (A-R model). This model can provide with 3D irregular surface topography and intentional geometrical characteristics from specified surface texture parameters. The measurement area consists of a periodical combination of the generated sampling area data. The surface roughness parameters introduced from the gauge data on a defined evaluation area can be insensitive to size and location of the evaluation area size. Adequate measuring conditions to utilize the surface material measures were investigated and then the evaluation area and sampling distance for areal profiling by a stylus instrument were clarified.
