The phase-shifting method is widely used in 3-D profile measurement with optoelectronic technology and phase unwrapping is an important link where in. The traditional methods are too complex and have low efficiency. A novel method of evaluating absolute phase is presented in this paper. The technique combined the grey code fringe with phase shifting technique and colored encoded grating pattern. The order of the projecting fringes ) , ( y x n can be obtained from only one distortional colored image. The procedure is relatively simple in experimental setup and algorithm. In addition, the speed of measurement is faster than current phase unwrapping algorithm. The experimental results have proved the validity of this method.