Characterization and Manipulation of Boron Nanowire inside SEM |
| Journal |
Key Engineering Materials (Volumes 381 - 382) |
| Volume |
Measurement Technology and Intelligent Instruments VIII |
| Edited by |
Wei Gao, Yasuhiro Takaya, Yongsheng Gao and Michael Krystek |
| Pages |
31-34 |
| DOI |
10.4028/www.scientific.net/KEM.381-382.31 |
| Online since |
June, 2008 |
| Authors |
Ming Chang,
C.H. Lin,
Juti Rani Deka
|
| Keywords |
Boron Nanowire, Buckling, EBID, Nanomanipulation, Nanoring, Scanning Electron Microscope (SEM), TEM |
| Abstract |
Nanostructures materials have stimulated broad attention in the past decade because of
their potential fundamental characteristics and its promising applications in nano electronic devices.
In the present investigation, crystalline boron nanowires (BNWs) were synthesized by vapor liquid
solid (VLS) technique and its mechanical properties were studied using a nanomanipulator inside a
scanning electron microscope (SEM). Electron beam induced deposition (EBID) method was used
to clamp boron nanowire to the AFM tips. The Young’s modulus of the NWs were determined from
the buckling instability of NW and computed to be approximately 131.7 ± 14.6GPa. In addition, the
nanomanipulation system was used to manipulate nanowire and built a nanoring. |
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