Paper Title:
New Synthetic Heterodyne Laser Doppler Vibrometer for Measurement of Mechanical Vibrations with Submicron Amplitude
  Abstract

A new synthetic heterodyne laser Doppler interferometer based on homodyne interferometer is addressed in this work. Interference signal includes the DC offset that is light intensity. The DC offset must be got rid because it does not need to obtain a velocity. The high pass filter is used instead of the subtractor. DC offset having random variation is difficult to get rid as using the subtractor itself. When the vibration amplitude is smaller than at least 1/ 2 of the wavelength of He-Ne laser, a serious problem of incorrect velocity measurement can be caused since there is non-zero crossing interference signal whose DC value can be eliminated in using the HPF. In order to solve this problem of using the HPF in the homodyne interferometer, a synthetic interferometer using a mechanical modulation method is proposed in this work by exciting a reference mirror with the displacement larger than the 1/2 of the wavelength. In this work, the analytical work is presented to show how the synthetic interferometer solves the problem of incorrect velocity measurement using the Fourier-Bessel function description of the interference signals. Simulation and Experimental works are also presented to validate the synthetic heterodyne interferometer proposed in the work.

  Info
Periodical
Key Engineering Materials (Volumes 381-382)
Edited by
Wei Gao, Yasuhiro Takaya, Yongsheng Gao and Michael Krystek
Pages
43-46
DOI
10.4028/www.scientific.net/KEM.381-382.43
Citation
S. G. Kang, J.P. La, H.S. Yoon, D.Y. Choi, K.H. Park, "New Synthetic Heterodyne Laser Doppler Vibrometer for Measurement of Mechanical Vibrations with Submicron Amplitude", Key Engineering Materials, Vols. 381-382, pp. 43-46, 2008
Online since
June 2008
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.

Authors: Li Jian, Li Hua Lei, Dong Sheng Li, Yun Xia Fu, Yuan Li, Jia Cheng Hu, Lin Juan Deng
Chapter 8: Testing, Detection, Measurement, Monitoring Technologies and Instruments
Abstract:White light interference technique for topography measurement effectively avoids phase ambiguity in phase-shifting interferometry. The...
904
Authors: Wan Duo Wu, Qiang Xian Huang, Chao Qun Wang, Ting Ting Wu, Hong Xie
Abstract:The technique utilizing single-frequency laser interferometry has very high measurement accuracy, but it has rigorous requirements for...
129