Measurement and Characterization of Surface Quality in Fast Tool Servo Machining of Optical Microstructures
| Periodical | Key Engineering Materials (Volumes 381 - 382) |
|---|---|
| Main Theme | Measurement Technology and Intelligent Instruments VIII |
| Edited by | Wei Gao, Yasuhiro Takaya, Yongsheng Gao and Michael Krystek |
| Pages | 517-520 |
| DOI | 10.4028/www.scientific.net/KEM.381-382.517 |
| Citation | Chi Fai Cheung et al., 2008, Key Engineering Materials, 381-382, 517 |
| Online since | June, 2008 |
| Authors | Chi Fai Cheung, Tsz Chun Kwok, Sandy To, Wing Bun Lee, Xiang Qian Jiang, H.F. Li |
| Keywords | Fast Tool Servo Machining, Optical Microstructures, Power Spectrum Analysis, Surface Characterization, Surface Generation |
| Price | US$ 28,- |
This paper presents a study of effect of cutting conditions on surface quality in FTS machining of optical microstructures such as micro-lens array. A power spectrum analysis is proposed to characterize the surface quality in FTS machining. It is found that there is a strong relationship between the surface roughness and the power spectrum of the surface profile. This provides an important means for the characterization of surface quality in FTS machining of optical microstructures.