Adaptive Fiber-Optical Sensor System for Pico-Strain and Nano-Displacement Metrology |
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| Journal | Key Engineering Materials (Volumes 381 - 382) |
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| Volume | Measurement Technology and Intelligent Instruments VIII |
| Edited by | Wei Gao, Yasuhiro Takaya, Yongsheng Gao and Michael Krystek |
| Pages | 61-64 |
| DOI | 10.4028/www.scientific.net/KEM.381-382.61 |
| Citation | Roman V. Romashko et al., 2008, Key Engineering Materials, 381-382, 61 |
| Online since | June, 2008 |
| Authors | Roman V. Romashko, Yuri Kul'chin, S.D. Girolamo, A. Kamshilin, J.C. Launay |
| Keywords | Adaptive Interferometer, Dynamic Hologram, Fiber Optical Sensor, Nano-Displacement Metrology, Photorefractive Crystal, Pico-Strain Metrology |
| Abstract | Adaptive fiber-optic interferometer which is based on multimode optical fiber as a sensor and diffusion holograms recorded in semiconductor photorefractive crystal CdTe:V without any electric field is developed. The interferometer sensitivity achieved is only 5.7 times less then highest sensitivity which is possible only in non-adaptive lossless classical interferometer. A practical detection limit is equal to Hz W nm 10 0 3 5 − × . , which allows to broadband detecting of an object’s displacement of order 0.2 nm or deformation of order 2 pε with using light sources having only 5 mW optical power. |
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