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Measurement Technology and Intelligent Instruments VIII

Key Engineering Materials Volumes 381 - 382

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• p529 Development of Nanometrology for Nanoelectronics: Growth and Characterization of Transition Metal Monolayer Films on Silicon   [ 1 M ]
  Authors: N.I. Plusnin, W.M. Il'yashenko, S.A. Kitan, S.V. Krylov
• p533 On the Measurement of Dielectric Constant of Coatings with Capacitance Sensors   [ 208 K ]
  Authors: Asur Guadarrama-Santana, Augusto García-Valenzuela
• p537 Broadband Dielectric Properties of the Ba₃MnTa₂O₉ Complex Perovskites   [ 183 K ]
  Authors: J.W. Chen, Bor Kai Wang, Jimmy C. Hsu, G.N. Rao
• p543 ESAD Shearing Deflectometry: A Primary Flatness Standard with Sub-Nanometer Uncertainty   [ 2 M ]
  Authors: Ralf D. Geckeler
• p547 Achieving Nanorad Level Stability of Beam Deflection with Scanning Pentaprisms   [ 1 M ]
  Authors: Ralf D. Geckeler
• p549 Traceable Dimension Metrology by AFM for Nanoscale Process Control   [ 325 K ]
  Authors: Tim Bao
• p553 Test Artefacts for the Verification of Optical Digitizers   [ 3 M ]
  Authors: Osamu Sato, Sonko Osawa, Toshiyuki Takatsuji, M. Murakami, R. Harada
• p557 Kalman Filter for Estimation of a Linear Regression Model with Account of the Regression Vector Error and its Application to Calibration of Measuring Instruments   [ 170 K ]
  Authors: Chingiz Hajiyev
• p561 Research on Specification Uncertainty in the Next Generation GPS   [ 181 K ]
  Authors: W. Lu, X. Liu, X. Jiang, Z. Xu
• p565 Traceable Nanometrology Realized by Means of Nanopositioning and Nanomeasuring Machine   [ 434 K ]
  Authors: Gerd Jäger, Eberhard Manske, T. Hausotte, R. Mastylo, N. Dorozhovets, N. Hofmann
• p569 Study on Scanning Squareness Measurement Method and Uncertainty Estimation   [ 149 K ]
  Authors: Xin Chen, Kiyoshi Takamasu
• p573 Improved Abbe Vertical Metroscope for the Calibration of Gauge Blocks   [ 172 K ]
  Authors: Sarwat Z.A. Zahwi, M. Bahrawy, Madyan Amer, N. Farid
• p577 Analysis of Gear Measurement Using Virtual Gear Checker (VGC)   [ 157 K ]
  Authors: Fumi Takeoka, Masaharu Komori, M. Takahashi, A. Kubo, Toshiyuki Takatsuji, Sonko Osawa, Osamu Sato
• p579 Industrial Robot Error Compensation Using Laser Tracker System   [ 235 K ]
  Authors: Jian Fei Ouyang, W. Liu, Xing Hua Qu, Y. Yan
• p583 Research on Measurement Uncertainty Evaluation Methods Based on Bayesian Principle   [ 162 K ]
  Authors: Xiao Huai Chen, Z.Y. Cheng, Ye Tai Fei