Paper Title:
Local Investigation of Microstructure-Induced Fatigue Damaging
  Abstract

From the emission of dislocations till short crack propagation fatigue is a local process determined by the microstructure. In this paper we present experiments based on refined applications of the scanning electron microscope and focused ion beam technique, which give detailed information about crack initiation and the interaction of short fatigue cracks with microstructural elements.

  Info
Periodical
Key Engineering Materials (Volumes 417-418)
Edited by
M.H Aliabadi, S. Abela, S. Baragetti, M. Guagliano and Han-Seung Lee
Pages
521-524
DOI
10.4028/www.scientific.net/KEM.417-418.521
Citation
M. Marx, W. Schäf, M. T. Welsch, H. Vehoff, "Local Investigation of Microstructure-Induced Fatigue Damaging", Key Engineering Materials, Vols. 417-418, pp. 521-524, 2010
Online since
October 2009
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Price
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