Paper Title:
Monte Carlo Investigation of Ferroelectric Properties in Thin Films
  Abstract

In this work, the ferroelectric hysteresis in thin films was investigated with Monte Carlo simulation using the DIFFOUR Hamiltonian and the Metropolis algorithm. The field frequency, the filed amplitude and the thickness dependence of hysteresis properties were found. For instance, at high enough field, the area increases, maintains and reduces with increasing frequency. However, with increasing the film’s thickness, the area increases over the whole considered frequencies, and the frequency at maximum area shifts to a lower frequency due to the stronger ferroelectric coupling in thicker films. This strongly indicates the thickness dependence of the ferroelectric hysteresis. In addition, the power law scaling relation between the hysteresis properties and input parameters, which are the film’s thickness and the field parameters, were proposed. The scaling exponents were compared and discussed with previous investigations on thin ferroelectric films.

  Info
Periodical
Key Engineering Materials (Volumes 421-422)
Edited by
Tadashi Takenaka, Hajime Haneda, Kazumi Kato, Masasuke Takata and Kazuo Shinozaki
Pages
177-181
DOI
10.4028/www.scientific.net/KEM.421-422.177
Citation
Y. Laosiritaworn, "Monte Carlo Investigation of Ferroelectric Properties in Thin Films", Key Engineering Materials, Vols. 421-422, pp. 177-181, 2010
Online since
December 2009
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$32.00
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