Paper Title:
Polarized Raman Study for Epitaxial PZT Thick Film with the Mixture Orientation of (100)/(001)
  Abstract

(100)/(001)-oriented PZT thick films were grown on SrRuO3//(100) SrTiO3 and (100) MgO substrates by matel organic chemical vapor deposition (MOCVD) with different volume fraction of (001) orientation, and were compared with (001) single-oriented epitaxial PZT thick films grown on SrRuO3//LaNiO3//(100) CaF2 by polarized Raman spectroscopy. The spectra from (100)-oriented domain and (001)-oriented domain can be individually observed for the films with the mixture orientation of (100)/(001). Raman analysis revealed the different strain state of (100)-oriented and (001)-oriented domains. Moreover, the rotation dependence of A1(1TO) mode could be explained by the calculation using the volume fraction of (001)-oriented domains obtained from X-ray reciprocal space mapping analysis for the films with the mixture orientation of (100)/(001). These results suggest the local structure characterized by Raman spectroscopy almost agreed with the structure characterized by XRD analysis for the films with the mixture orientation of (100)/(001).

  Info
Periodical
Key Engineering Materials (Volumes 421-422)
Edited by
Tadashi Takenaka, Hajime Haneda, Kazumi Kato, Masasuke Takata and Kazuo Shinozaki
Pages
99-102
DOI
10.4028/www.scientific.net/KEM.421-422.99
Citation
M. Nakajima, T. Fujisawa, K. Nishida, T. Yamamoto, M. Osada, H. Naganuma, S. Okamura, H. Funakubo, "Polarized Raman Study for Epitaxial PZT Thick Film with the Mixture Orientation of (100)/(001)", Key Engineering Materials, Vols. 421-422, pp. 99-102, 2010
Online since
December 2009
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Price
$32.00
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