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Measurement Technology and Intelligent Instruments IX

Key Engineering Materials Volume 437

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• p-11 Preface   [ 59 K ]
• p-9 Sponsors and Committees   [ 110 K ]
• p-3 List of Reviewers   [ 81 K ]
• p3 Principles of Bayesian Methods in Data Analysis   [ 155 K ]
  Authors: Michael Paul Krystek
• p8 Dynamic Pressure Calibration of Pressure Sensors Using Liquid Step Pressure Generator   [ 1 M ]
  Authors: Sheng Hung Wang, Lee Long Han, Tsing Tshih Tsung
• p13 Topical Tasks of Metrology due to Measuring Instruments Computerization   [ 150 K ]
  Authors: Valery S. Aleхandrov, Roald E. Taymanov, Anna G. Chunovkina
• p18 Multivariant System of Perspectives   [ 159 K ]
  Authors: Aristarkh M. Kovalev
• p25 Coherent Optical Method for Studies of Nanoscale Objects in Liquid Media Based upon Spatial Averaging of Data   [ 280 K ]
  Authors: Yuriy N. Kulchin, Oleg B. Vitrik, Alexey D. Lantsov, Natalya P. Kraeva
• p30 Measurement and Visualization of Dynamics of Piezoelectric Microcantilever   [ 779 K ]
  Authors: Wei Jie Dong, Meng Wei Liu, Cui Yan
• p35 Microrelief Measurements for White-Light Interferometer with Adaptive Algorithm Interferogram Processing   [ 2 M ]
  Authors: Evgeny V. Sysoev, Rodion V. Kulikov
• p40 Model-Based Correction of Image Distortion in Scanning Electron Microscopy   [ 372 K ]
  Authors: Dominic Gnieser, Carl Georg Frase, Harald Bosse, Rainer Tutsch
• p45 Motif Parameters Based Characterization of Line Edge Roughness of a Nanoscale Grating Structure   [ 203 K ]
  Authors: Zhuang De Jiang, Feng Xia Zhao, Wei Xuan Jing, Philip D. Prewett, Kyle Jiang
• p51 Nanorelief Measurements Errors for a White-Light Interferometer with Chromatic Aberrations   [ 219 K ]
  Authors: Evgeny V. Sysoev
• p56 Fabrication of Large Grating by Monitoring the Latent Fringe Pattern   [ 898 K ]
  Authors: Li Jiang Zeng, Lei Shi, Li Feng Li
• p61 Design and Analysis of a 6-DOF Monolithic Nanopositioning Stage   [ 166 K ]
  Authors: Ling Li Cheng, Jian Wei Yu, Xiao Fen Yu