Paper Title:
Innovations in X-Ray Induced Electron Emission Spectrometry (XIEES)
  Abstract

In modern sciences and technologies it is required to investigate local atomic and electron structure of matter independently on its aggregate state. There are advanced methods aimed at short order. These methods are based on the phenomena accompanied by interference of secondary electrons excited by primary X-ray radiation. Such methods are known as XAFS (X-ray absorption fine structure). These methods are based mainly on using of synchrotron radiation. It is realized in two modes: ‘transmission mode’ and registration of secondary effects that follow the primary X-ray absorption. One may announce only two such effects: X-ray induced fluorescence and X-ray induced electron emission (photoeffect). However, the access to synchrotron rings is problematic for the most users. This fact supposes the necessity to develop laboratory devices of direct urgent access. Since the power of laboratory X-ray sources is much less than the flux from synchrotrons, it is necessary to use secondary electron detectors of considerably higher efficiency. Moreover, it is attractive to possess energy in spatial resolution. Channeltrons and multi-channel plates do not have such abilities. That is why the advanced electron detector was developed and exposed to photoeffect under acceleration field. The work is performed within the frames of ISTC Project #3157.

  Info
Periodical
Edited by
Yuri Chugui, Yongsheng Gao, Kuang-Chao Fan, Roald Taymanov and Ksenia Sapozhnikova
Pages
631-635
DOI
10.4028/www.scientific.net/KEM.437.631
Citation
K. J. Pogrebitsky, M. D. Sharkov, "Innovations in X-Ray Induced Electron Emission Spectrometry (XIEES)", Key Engineering Materials, Vol. 437, pp. 631-635, 2010
Online since
May 2010
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$35.00
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