Paper Title:
Computed Tomography for Application in Manufacturing Metrology
  Abstract

As a rather new technology, X-Ray Computed Tomography offers new and promising possibilities in manufacturing metrology in comparison to well-established tactile or optical measurements. The main benefit is the volumetric model which results of each measurement and represents the measurement object holistically with high point density.

  Info
Periodical
Edited by
Yuri Chugui, Yongsheng Gao, Kuang-Chao Fan, Roald Taymanov and Ksenia Sapozhnikova
Pages
73-78
DOI
10.4028/www.scientific.net/KEM.437.73
Citation
A. Weckenmann, P. Krämer, "Computed Tomography for Application in Manufacturing Metrology", Key Engineering Materials, Vol. 437, pp. 73-78, 2010
Online since
May 2010
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$32.00
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