Measurement Technology and Intelligent Instruments IX
Key Engineering Materials Volume 437
doi:10.4028/www.scientific.net/KEM.437
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p598
Thermal Effects of Platinum Bottom Electrodes on PZT Sputtered Thin Films Used in MEMS Devices
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2 M
]
Authors: Ali Koochekzadeh, Eskandar Keshavarz Alamdari, Abod Al Ghafar Barzegar, Ali A. Salardini -
p603
Requirements on a Differential Refractometer for its Use in Sizing Colloidal Particles
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177 K
]
Authors: Augusto García-Valenzuela, Celia Sánchez Pérez -
p611
Assessment of the Ukrainian Quality Infrastructure: Challenges Imposed by the WTO and Commitments to EU Accession
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168 K
]
Authors: M.N. Frota, J.L. Racine, F. Blanc, P. Rodrigues, S. Ibragimov, D. Torkhov, S. Osavolyuk -
p616
Analysis of Phase Distribution of Focused Light in High Numerical Aperture Systems
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206 K
]
Authors: Alexander Normatov, Boris Spektor, Joseph Shamir -
p621
Torsion Magnetic Variometer with Kevlar-Hanger-Based Sensor
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422 K
]
Authors: Yuri A. Kopytenko, Pavel A. Sergushin, Maksim S. Petrishchev, Valery А. Levanenko, Dmitry B. Zaytsev -
p625
Device for Manufacturing Torsion Bars with Helical Anisotropy UISAT-1
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340 K
]
Authors: Yuri A. Kopytenko, Pavel A. Sergushin, Maksim S. Petrishchev, Valery А. Levanenko, Anna D. Perechesova -
p631
Innovations in X-Ray Induced Electron Emission Spectrometry (XIEES)
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1 M
]
Authors: Konstantin J. Pogrebitsky, Michael D. Sharkov -
p636
Tests of Model of Absolute Measuring Instrument of Synchrotron Radiation Power
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172 K
]
Authors: Igor A. Khrebtov, Valeriy G. Malyarov, Vladimir Y. Zerov, Anton D. Nikolenko, Valeriy F. Pindyurin, Aleksandr A. Legkodymov, Vladimir V. Lyah -
p641
Advantages in the Small-Angle Scattering of X-Ray for Studying Optoelectronic Devices within the Frames of ISTC Projects
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553 K
]
Authors: Michael E. Boiko, Andrei M. Boiko
