Paper Title:
Comparison of Thermal Stability of Epitaxially Grown (La0.5Sr0.5)CoO3 and (La0.6Sr0.4)MnO3 Thin Films Deposited on Si Substrate
  Abstract

Thermal stability of bottom electrode thin films (La0.5Sr0.5)CoO3 (LSCO) and (La0.6Sr0.4)MnO3 (LSMO) were investigated. The crystallization and surface morphology of the heterostructure were characterized using x-ray diffraction and atomic force microscopy. Resistivity of the LSCO thin film was 25 cm. However, the resistivity of LSCO thin film increases sharply with annealing temperature. The LSMO thin film has high resistivity (100 mcm). The film does not decompose after thermal processing at 900 °C. To confirm thermal stability, we examined the effect of post annealing at various temperatures on the morphology and resistivity. Results showed that LSMO has higher thermal stability than that of LSCO.

  Info
Periodical
Edited by
Shinobu Fujihara and Tadashi Takenaka
Pages
160-163
DOI
10.4028/www.scientific.net/KEM.445.160
Citation
S. Sawamura, N. Sakamoto, D. S. Fu, K. Shinozaki, H. Suzuki, N. Wakiya, "Comparison of Thermal Stability of Epitaxially Grown (La0.5Sr0.5)CoO3 and (La0.6Sr0.4)MnO3 Thin Films Deposited on Si Substrate", Key Engineering Materials, Vol. 445, pp. 160-163, 2010
Online since
July 2010
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