Paper Title:
Preparation and Characterization of La0.8Sr0.2Ga0.8Mg0.2O3-δ Film by Electrophoretic Deposition Method
  Abstract

La0.8Sr0.2Ga0.8Mg0.2O3-δ (LSGM) precursor particles were successfully prepared by ultrasonic spray pyrolysis. LSGM thin films were prepared by the electrophoretic deposition (EPD) technique using ethanol containing iodine. The LSGM films were obtained by sintering at 1300 °C for 10 h. The X-ray diffraction patterns revealed that the diffraction peak of LSGM thin films was in agreement with the perovskite structure. The LSGM films attained a uniform thickness of 10 μm.

  Info
Periodical
Edited by
Shinobu Fujihara and Tadashi Takenaka
Pages
86-90
DOI
10.4028/www.scientific.net/KEM.445.86
Citation
A. Toriyama, K. Myoujin, T. Kodera, T. Ogihara, "Preparation and Characterization of La0.8Sr0.2Ga0.8Mg0.2O3-δ Film by Electrophoretic Deposition Method", Key Engineering Materials, Vol. 445, pp. 86-90, 2010
Online since
July 2010
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