Paper Title:
Stress State Localized Analysis on the Tip of the Crack
  Abstract

In this paper is presented a study of the analysis of the stress state of micro specimens exposed to a load inside the column of a High Voltage Electron Microscope (HVTEM), in particular for a Mo single crystal. The experimental tangential stresses distribution images were obtained and compared with theoretical calculations using Naiber approach, obtaining an excellent match.

  Info
Periodical
Main Theme
Edited by
Alexander Balankin, José Martínez Trinidad and Orlando Susarrey Huerta
Pages
87-95
DOI
10.4028/www.scientific.net/KEM.449.87
Citation
P. A. Tamayo Meza, P. S. Schabes-Retchkiman, A. Lazo Noguez, V. A. Yermishkin, "Stress State Localized Analysis on the Tip of the Crack", Key Engineering Materials, Vol. 449, pp. 87-95, 2010
Online since
September 2010
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