Paper Title:
Magnetic Compton Profile Measurement of Thin Films
  Abstract

We have measured magnetic Compton profile of Co/Pd thin films sputtered on a substrate for studying the electronic structure. For the first time, a silicon nitride substrate of 100 nm thickness we used in the magnetic Compton scattering experiment. We have improved vacuum tubes of the Compton beam-line BL08W of SPring-8, and have reduced greatly the background scattering for the Compton profile. We have succeeded in measuring magnetic Compton profile of Co (0.8 nm)/Pd (1.6 nm) 400 nm multilayer.

  Info
Periodical
Edited by
Osamu Hanaizumi and Masafumi Unno
Pages
11-14
DOI
10.4028/www.scientific.net/KEM.459.11
Citation
H. Nishino, R. Yamaki, M. Itou, Y. Sakurai, H. Sakurai, M. Ito, "Magnetic Compton Profile Measurement of Thin Films", Key Engineering Materials, Vol. 459, pp. 11-14, 2011
Online since
December 2010
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