Paper Title:
Non-Destructive Characterization of Micro-Sized Defects in the Solar Cell Structure
  Abstract

This article discusses the issue of noise measurements application for the quality assessment of the solar cells themselves and production technology alike. The main focus of our research is the random n-level (in most case just two-level) impulse noise, usually referred to as microplasma noise. This noise was found to be in a direct consequence of local breakdowns in micro-sized regions and brings about a reduction of lifetime or a destruction of the pn junction. Non-destructive measurement methodology as presented here is suitable for testing of a large number of various semiconductor devices not only for solar cells. In this paper experimental measurement of noise signals in the frequency and time domain is presented. Furthermore the microplasma noise behaviour and defect geometry is discussed.

  Info
Periodical
Edited by
Pavel Šandera
Pages
314-317
DOI
10.4028/www.scientific.net/KEM.465.314
Citation
R. Macku, P. Koktavý, P. Škarvada, "Non-Destructive Characterization of Micro-Sized Defects in the Solar Cell Structure", Key Engineering Materials, Vol. 465, pp. 314-317, 2011
Online since
January 2011
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