Paper Title:
Strain Mapping by Scanning Low Energy Electron Microscopy
  Abstract

The use of the scanning low energy electron microscopy (SLEEM) has been slowly making its way into the field of materials science, hampered not by limitations in the technique but rather by relative scarcity of these instruments in research institutes and laboratories. This paper reports the results obtained from an investigation of the microstructure of ultra fine-grained (UFG) copper fabricated using equal channel angular pressing (ECAP) method, namely in the as-pressed state and after annealing. SLEEM is very sensitive to the perfection of crystal lattice and using SLEEM, local strain can be effectively imaged.

  Info
Periodical
Edited by
Pavel Šandera
Pages
338-341
DOI
10.4028/www.scientific.net/KEM.465.338
Citation
Š. Mikmeková, O. Man, L. Pantělejev, M. Hovorka, I. Müllerová, L. Frank, M. Kouřil, "Strain Mapping by Scanning Low Energy Electron Microscopy", Key Engineering Materials, Vol. 465, pp. 338-341, 2011
Online since
January 2011
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