Paper Title:
K-S Relationship Identification Technique by EBSD
  Abstract

This paper focuses on the identification of activated slip system in flat specimens of hot- and cold-rolled UNS S32750 DSS plates subjected to low-cycle fatigue, paying particular attention on the existence of the K-S relationship. Electron Backscattered Diffraction (EBSD) technique was used to determine the local crystallographic properties of both phases. Although 27182 couples of α/γ grains were analyzed, the crystallographic K-S relationships were rarely observed between them. As a conclusion, it was observed that microcracks were mostly nucleated at grain boundaries and rarely at the extrusions.

  Info
Periodical
Edited by
Pavel Šandera
Pages
415-418
DOI
10.4028/www.scientific.net/KEM.465.415
Citation
M.C. Marinelli, M.G. Moscato, J. Signorelli, A. El Bartali, I. Alvarez-Armas, "K-S Relationship Identification Technique by EBSD", Key Engineering Materials, Vol. 465, pp. 415-418, 2011
Online since
January 2011
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