Paper Title:
Study on the Luminescence and Reflection Spectra of Al2O3 Doped Er2O3 Films on Si Substrates
  Abstract

Amorphous Al2O3 doped Er2O3 films were deposited on Si(001) substrates by radio frequency magnetron sputtering technique. Emission spectra exhibit a strong emission band around 410 nm and a series of emission band near 970, 980, 1018, 1042 and 1080nm. Ellipsometry measurements show that the refractive index of the ErAlO films in the region of 400~1000 nm is between 1.76-1.83. The reflectivity of the ErAlO on Si is much smaller than that of clean Si and pure Er2O3 films. All the results indicate that ErAlO could be a promising material for Si solar cells.

  Info
Periodical
Key Engineering Materials (Volumes 474-476)
Edited by
Garry Zhu
Pages
345-348
DOI
10.4028/www.scientific.net/KEM.474-476.345
Citation
Y. Y. Zhu, Z. B. Fang, Y. Zhao, H. Y. Li, J. Chen, H. J. Cao, "Study on the Luminescence and Reflection Spectra of Al2O3 Doped Er2O3 Films on Si Substrates", Key Engineering Materials, Vols. 474-476, pp. 345-348, 2011
Online since
April 2011
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