Paper Title:
The Kelvin Probe Force Microscopy Measurement of Degraded Multilayer Ceramic Capacitors with Ni Inner Electrode
  Abstract

Electric potential mapping of degraded dielectric layers of multilayer ceramic capacitors (MLCCs) was carried out using Kelvin probe force microscopy in order to clarify their degradation mechanism under conditions of an accelerated lifetime test condition. In the cross sections of the degraded and as-prepared dielectric layers, a significant electric field concentration was found in the vicinity of the anode of the degraded dielectric layer, in contrast to a homogeneous concentration found throughout layers of the samples before the accelerated lifetime test.

  Info
Periodical
Edited by
Chazono Hirokazu, Fujihara Shinobu, Katayama Keiichi, Masumoto Hiroshi, Mizoguchi Teruyasu, Osada Minoru, Shinozaki Kazuo and Takeda Hiroaki
Pages
47-50
DOI
10.4028/www.scientific.net/KEM.485.47
Citation
T. Okamoto, N. Inoue, S. Kitagawa, H. Niimi, A. Ando, H. Takagi, "The Kelvin Probe Force Microscopy Measurement of Degraded Multilayer Ceramic Capacitors with Ni Inner Electrode", Key Engineering Materials, Vol. 485, pp. 47-50, 2011
Online since
July 2011
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$32.00
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