Paper Title:
Radiation Dosimeter Based on Metal-Oxide-Semiconductor Structures Containing Silicon Nanocrystals
  Abstract

MOS structures containing silicon nanocrystals in the gate dielectric have been tested as dosimeters for ionizing radiation. Before irradiation the nanocrystals have been charged with electrons by applying a pulse to the gate electrode. The γ-irradiation with doses in the range 0-100 Gy causes approximately linear variation of the flatband voltage, resulting in sensitivities of ~ 2.5 mV/Gy. At higher doses the sensitivity decreases because of decrease of the oxide electric field.

  Info
Periodical
Edited by
E. Hristoforou and D.S. Vlachos
Pages
120-123
DOI
10.4028/www.scientific.net/KEM.495.120
Citation
N. Nedev, E. Manolov, D. Nesheva, K. Krezhov, R. Nedev, M. Curiel, B. Valdez, A. Mladenov, Z. Levi, "Radiation Dosimeter Based on Metal-Oxide-Semiconductor Structures Containing Silicon Nanocrystals", Key Engineering Materials, Vol. 495, pp. 120-123, 2012
Online since
November 2011
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