Paper Title:
Possibilities for Thick, Simple-Structure Silicon X-Ray Detectors Operated by Peltier Cooling
  Abstract

We have proposed two types of simple-structure silicon (Si) X-ray detectors with 1.5-mm-thick high-resistivity Si substrates, which are able to be operated at reasonably low negative bias and cooled by Peltier cooling. Since the device structures are simple and the detectors require only one high voltage, the cost of the X-ray detection system can be reduced very much. Moreover, the absorption of cadmium X-ray fluorescence (energy: 23.1 keV) in 1.5-mm-thick Si is approximately 65%, whereas in commercial silicon drift detectors (Si thickness: approximately 0.3 mm), it is approximately 19%. We have simulated the electric potential distribution within the proposed detectors and carried out fundamental experiments towards the realization of the detectors.

  Info
Periodical
Edited by
E. Hristoforou and D.S. Vlachos
Pages
294-297
DOI
10.4028/www.scientific.net/KEM.495.294
Citation
H. Matsuura, D. Hullinger, R. Okada, S. Kitanoya, S. Nishikawa, K. Decker, "Possibilities for Thick, Simple-Structure Silicon X-Ray Detectors Operated by Peltier Cooling", Key Engineering Materials, Vol. 495, pp. 294-297, 2012
Online since
November 2011
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