Paper Title:
Band Gap and Conductivity Measurement of TiO2 Thin Films Deposited by Sol-Gel Spin Coating Method
  Abstract

Thin films of TiO2 have been deposited on to cleaned glass substrate by sol gel spin coating method. The XRD analyses confirm different crystalline phases of TiO2 thin films. The grain size calculated by the help of Scherer’s formula and found to be 23nm, 37nm and 54 nm respectively for TiO2(004), TiO2(200) and TiO2(211) orientations. The band gap was calculated 3.6 eV by UV-spectrophotometer. The refractive index of the TiO2 film was measured by Ellipsometry and found to be 2.33. Conductivity was measured using Current voltage (I-V) characteristics. To determine composition and thermal stability, thermo gravimetric Analyzer (TGA) and Differential Scanning Calorimeter (DSC) analysis was made on samples.

  Info
Periodical
Chapter
Chapter 1: Material Engineering and Technology
Edited by
David Wang
Pages
273-277
DOI
10.4028/www.scientific.net/KEM.500.273
Citation
D. Rathee, M. Kumar, S. K. Arya, M. Sharma, "Band Gap and Conductivity Measurement of TiO2 Thin Films Deposited by Sol-Gel Spin Coating Method", Key Engineering Materials, Vol. 500, pp. 273-277, 2012
Online since
January 2012
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$32.00
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