Paper Title:
Phase Transition Characterization Dependent on Temperature and DC Electric Field for (Pb, La) (Zr, Ti)O3 Antiferroelectric Thick Films
  Abstract

Pb0.97La0.02(Zr0.95Ti0.05)O3 antiferroelectric thick films were prepared on platinized silicon substrates by sol–gel methods. Films showed polycrystalline perovskite structure with a strong (100) preferred orientation. The antiferroelectric nature of the films was confirmed by the double hysteresis behaviors versus applied field. The temperature dependence of dielectric constant and loss displayed the Curie temperature was 225oC.The current caused by the polarization and depolarization of polar was detected at coupling application of electric field and temperature. The phase transition characterization could be effectively adjusted by electric field and temperature.

  Info
Periodical
Chapter
Chapter 1: Micro/Nano Transducer/Acutar/Robot
Edited by
Xiaohao Wang
Pages
97-102
DOI
10.4028/www.scientific.net/KEM.503.97
Citation
X. J. Chou, M. X. Du, Y. B. Lv, J. Liu, W. D. Zhang, "Phase Transition Characterization Dependent on Temperature and DC Electric Field for (Pb, La) (Zr, Ti)O3 Antiferroelectric Thick Films", Key Engineering Materials, Vol. 503, pp. 97-102, Feb. 2012
Online since
February 2012
Price
US$ 28,-
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