Paper Title:
Standardization of Grain Boundary Etching Test Method for Evaluating High Temperature Material Degradation
  Abstract

  Info
Periodical
Key Engineering Materials (Volumes 51-52)
Edited by
Kang Yong Lee and Hideaki Takahashi
Pages
247-252
DOI
10.4028/www.scientific.net/KEM.51-52.247
Citation
F. Nogata, K. Seo, S. H. Chung, J. J. Lee, H. Takahashi, K. Tamagawa, "Standardization of Grain Boundary Etching Test Method for Evaluating High Temperature Material Degradation", Key Engineering Materials, Vols. 51-52, pp. 247-252, 1991
Online since
January 1991
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Price
$32.00
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