Optical Characterization of Semiconductors
Key Engineering Materials Volume 65
doi:10.4028/www.scientific.net/KEM.65
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p1
Optical Investigation of Novel PbTe p-i-n-i-p Structures
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5 M
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p19
Optical Control of Electrical and Structural Thin Film Prperties
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2 M
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p27
Optical Indentification of PbO Films Crystal Modification
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2 M
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p35
Optical Spectroscopy of GaAs Layers Grown by MOVPE
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2 M
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p43
Optical Properties of Amorphous and Microcrystalline Si-Ge Thin Films
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2 M
]
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p51
The Influece of High-Temperature Annealing on the Transient Optical and Structure Properties of Semi-Insulating GaAs
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1 M
]
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p57
Radiative and Nonradiative Recombination Processes in Ion Implanted Semi-Insulating GaAs
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1 M
]
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p63
EL2 Intracenter Transition in Photoconductivity Spectra of Semi-Insulating GaAs:Cr
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2 M
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p71
IR Reflection from Semiconductor Multilayered Structures with the Composition Gradient Layers
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2 M
]
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p79
The Energy Gaps in SiXGe1-X Alloys
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2 M
]
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p87
Optical Characterization of Monolayer Islands and Interface Effects in InGaAs/InP Multiquantum Well Structures
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1 M
]
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p93
Photoluminescence Probing the Si Incorporation in MBE Grown AlXGa1-XAs
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2 M
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p101
Associates of Charged Defects in Gallium Arsenide: Calculation and Photoluminescence Data
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2 M
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p109
Photoluminescence of Bismuth Doped GaSb
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2 M
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p117
Optical Effects in Thin Layers
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2 M
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