Paper Title:
Micro-Scale and Nano-Scale Testing of Materials Using Scanned Probe Technologies
  Abstract

  Info
Periodical
Key Engineering Materials (Volumes 86-87)
Edited by
S. Hampshire, M. Buggy and A. J. Carr
Pages
207-214
DOI
10.4028/www.scientific.net/KEM.86-87.207
Citation
M. Phelan, L. McDonnell, E.M. Cashell, J.O. Dalton, "Micro-Scale and Nano-Scale Testing of Materials Using Scanned Probe Technologies", Key Engineering Materials, Vols. 86-87, pp. 207-214, 1993
Online since
July 1993
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.