Micro-Scale and Nano-Scale Testing of Materials Using Scanned Probe Technologies |
| Journal |
Key Engineering Materials (Volumes 86 - 87) |
| Volume |
Engineered Materials |
| Edited by |
S. Hampshire, M. Buggy and A. J. Carr |
| Pages |
207-214 |
| DOI |
10.4028/www.scientific.net/KEM.86-87.207 |
| Citation |
M. Phelan et al., 1993, Key Engineering Materials, 86-87, 207 |
| Authors |
M. Phelan, L. McDonnell, E.M. Cashell, J.O. Dalton |
| Keywords |
Material Testing, Scanning Force Microscopy, Scanning Probe |
| Full Paper |
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