High-Resolution Electron Microscopy Studies on Si3N4 Ceramics
| Periodical | Key Engineering Materials (Volumes 89 - 91) |
|---|---|
| Main Theme | Silicon Nitride '93 |
| Edited by | Michael J. Hoffmann, Paul F. Becher and Günther Petzow |
| Pages | 339-344 |
| DOI | 10.4028/www.scientific.net/KEM.89-91.339 |
| Citation | H.J. Kleebe, 1993, Key Engineering Materials, 89-91, 339 |
| Authors | H.J. Kleebe |
| Keywords | Grain Boundary Films, High Resolution Electron Microscopy (HREM), Interface Chemistry, Mechanical Property |
| Price | US$ 28,- |