Paper Title:

High-Resolution Electron Microscopy Studies on Si3N4 Ceramics

Periodical Key Engineering Materials (Volumes 89 - 91)
Main Theme Silicon Nitride '93
Edited by Michael J. Hoffmann, Paul F. Becher and Günther Petzow
Pages 339-344
DOI 10.4028/www.scientific.net/KEM.89-91.339
Citation H.J. Kleebe, 1993, Key Engineering Materials, 89-91, 339
Authors H.J. Kleebe
Keywords Grain Boundary Films, High Resolution Electron Microscopy (HREM), Interface Chemistry, Mechanical Property
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