Paper Title:
Investigation of α-SiAlON Formation by High Temperature X-Ray Diffraction
  Abstract

  Info
Periodical
Key Engineering Materials (Volumes 89-91)
Main Theme
Edited by
Michael J. Hoffmann, Paul F. Becher and Günther Petzow
Pages
373-380
DOI
10.4028/www.scientific.net/KEM.89-91.373
Citation
A. Ashkin, D. Ashkin, O. Babushkin, "Investigation of α-SiAlON Formation by High Temperature X-Ray Diffraction ", Key Engineering Materials, Vols. 89-91, pp. 373-380, 1994
Online since
August 1993
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Price
$35.00
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