Paper Title:
Study of Grain Boundary Phase in Silicon Nitride Materials by Raman Spectroscopy
  Abstract

  Info
Periodical
Key Engineering Materials (Volumes 89-91)
Main Theme
Edited by
Michael J. Hoffmann, Paul F. Becher and Günther Petzow
Pages
495-500
DOI
10.4028/www.scientific.net/KEM.89-91.495
Citation
T. Laoui, O. Van der Biest, "Study of Grain Boundary Phase in Silicon Nitride Materials by Raman Spectroscopy", Key Engineering Materials, Vols. 89-91, pp. 495-500, 1994
Online since
August 1993
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Price
$32.00
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