Study of Grain Boundary Phase in Silicon Nitride Materials by Raman Spectroscopy
| Periodical | Key Engineering Materials (Volumes 89 - 91) |
|---|---|
| Main Theme | Silicon Nitride '93 |
| Edited by | Michael J. Hoffmann, Paul F. Becher and Günther Petzow |
| Pages | 495-500 |
| DOI | 10.4028/www.scientific.net/KEM.89-91.495 |
| Citation | T. Laoui et al., 1993, Key Engineering Materials, 89-91, 495 |
| Authors | T. Laoui, Omer Van der Biest |
| Keywords | Grain Boundary Phase, Raman Spectroscopy |
| Price | US$ 28,- |