Paper Title:

Study of Grain Boundary Phase in Silicon Nitride Materials by Raman Spectroscopy

Periodical Key Engineering Materials (Volumes 89 - 91)
Main Theme Silicon Nitride '93
Edited by Michael J. Hoffmann, Paul F. Becher and Günther Petzow
Pages 495-500
DOI 10.4028/www.scientific.net/KEM.89-91.495
Citation T. Laoui et al., 1993, Key Engineering Materials, 89-91, 495
Authors T. Laoui, Omer Van der Biest
Keywords Grain Boundary Phase, Raman Spectroscopy
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