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High Temperature Investigations of Silicon by Means of Positron Annihilation

Journal Materials Science Forum (Volumes 10 - 12)
Volume Defects in Semiconductors 14
Edited by H.J. von Bardeleben
Pages 103-113
DOI 10.4028/www.scientific.net/MSF.10-12.103
Citation S. Dannefaer, 1986, Materials Science Forum, 10-12, 103
Authors S. Dannefaer
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